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   Camera & Imaging

CSI-2

Camera Command Set

Camera Service Extensions

Camera Security Framework


   Physical Layers

A-PHY

A-PHY PALs

C-PHY

D-PHY

M-PHY
       Display

    DSI

    DSI-2

    Display Command Set

    Display Service Extensions


       Audio

    SoundWire

    SLIMbus
         Control & Data

      Battery Interface

      I3C and I3C Basic

      RF Front-End

      System Power Management


         Chip-to-Chip/IPC

      DigRF

      UniPro


         Security

      Camera Security Framework
           Debug & Trace

        Debug Over I3C

        Debug Over IPS

        Debug Over PCIe

        Debug Over UCIe

        Gigabit Debug for USB

        High-Speed Trace Interface

        Narrow Interface for Debug & Test

        Parallel Trace Interface

        SneakPeek Protocol

        System Trace Protocol

        System Software Trace

        Trace Wrapper Protocol
             Software Integration

          DisCo

          DisCo for I3C

          DisCo for Imaging

          DisCo for NIDnT

          DisCo for SoundWire

          I3C HCI

          I3C TCRI

          SoundWire Device Class for Audio (SDCA)


             Software Code

          Camera Command Set Tools

          SyS-T Instrumentation Library

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            Mohamed Hafed, Ph.D., CEO at Introspect Technology

            5 min read

            Addressing the Challenges in High-Volume Production Testing of MIPI-Specification-Based Devices

            Picture of Mohamed Hafed, Ph.D., CEO at Introspect Technology Mohamed Hafed, Ph.D., CEO at Introspect Technology: 18 May 2020

            The latest trend for semiconductor device manufacturers is to add several high-speed MIPI® specification-based ports to a single device. This enables feature-rich implementations of imaging- and display-intensive applications, although it also poses...

            Camera Test MIPI D-PHY MIPI C-PHY
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